When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...
Counterfeit electronic components are an increasing threat to the supply chain for consumer, industrial and, more importantly, military parts. Some counterfeit parts are like counterfeit money, ...
This paper describes the development of a Dynamic Door Component Test Methodology (DDCTM) for side impact simulation. A feasibility study of the methodology was conducted using a MADYMO computer model ...
When checking and verifying capacitors, inductors, diodes, bipolar transistors, and cables, the gamut of test methods can range from those used to confirm a defective component to identifying the ...
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