SiC is extensively used in microelectronic devices owing to its several unique properties. However, low yield and high cost of the SiC manufacturing process are the major challenges that must be ...

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.

As device sizes continue to increase on devices at 2x nm design rule and beyond and high wafer stress is worsening due to multi-film stacking in the vertical memory process, we observe an increasing ...

The company said that its new FMAlert feature for all G6 optical sorters is a powerful food safety tool as it enables sorters to capture and save a digital image of objects identified as foreign ...

Stylus-based surface profiling is a standard technique for accurate, repeatable surface shape, topography and step height measurement in applications ranging from semiconductor R&D to solar cell QC.

Originating as a theoretical prediction in the 1940s, with experimental isolation from graphite in 2004, graphene has quickly ...