Use precise geolocation data and actively scan device characteristics for identification. This is done to store and access ...

SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...

With the demand for high-performnce materials increasing, it has become necessary to optimize their structural properties at the nanoscale, underscoring the importance of systematic and routine ...

Knowledge of the microscopic structure and composition of materials is essential for understanding their properties and designing functional devices. Microscopy techniques based on electrons and X ...