Harmony eXP, a full-wafer-contact probe card from FormFactor, can test more than 1000 DRAM devices per touchdown and is capable (for some device designs) of supporting one-touchdown testing of a full ...
Delray Beach, FL, March 02, 2026 (GLOBE NEWSWIRE) -- The report "Probe Pin Market by Pogo Type, Stamping Type, Spring Contact, Non-Spring Contact, Semiconductor Testing (Wafer-level Testing, and ...
The market growth is driven by increasing semiconductor testing volumes, advanced node scaling, rising adoption of high-frequency and fine-pitch probes, and expanding OSAT and wafer-level testing ...
FormFactor has announced a milestone with the shipment of its first 26,000 pin-count wafer-probe card, which is based on the company’s new PH150XP platform. Representing the highest pin-count product ...
Plug & Play: the hybrid probe card UFO Probe® Card can be integrated into existing standard IC wafer probers without much effort. Picture made by Tobias Gnausch, Jenoptik. Plug & Play: the hybrid ...
A new technical paper titled “Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip” was published by researchers at Inha University and Teradyne. ...
Over the past 10 years, the DRAM market has been one of the toughest commodity businesses in the electronics industry. Bit growth has averaged more than 60% per year, but at the same time, cycles of ...
A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...
Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...
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