Scan a form to put on a computer for others to use as a sample when completing a physical version of the form. If you scan a form to a computer without marking it as a sample, others may print and use ...

Why non-destructive SAM is an efficient tool for analysis of adhesion between layers and presence of possible flaws in each layer. Scanning acoustic microscopy, or SAM, is a non-destructive technique ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Measuring magnetic fields inside samples has only been possible indirectly up to now. Magnetic orientations can be scanned with light, X-rays, or electrons - but only on the surfaces of materials.

We’ve all likely seen the amazing images possible with a scanning electron microscope. An SEM can yield remarkably detailed 3D images of the tiniest structures, and they can be invaluable tools for ...

BERLIN—Measuring magnetic fields inside samples has only been possible indirectly up to now. Magnetic orientations can be scanned with light, X-rays, or electrons—but only on the surfaces of materials ...