This article focuses on atomic force microscopy, electrochemical impedance spectra, and the interrelation between the two concepts. Image processing of anchored bilayers, such as tethered bilayer ...
InSight 300 is a fabrication-ready, automated atomic force microscope (AAFM) engineered for dependable and economical inline metrology in high-volume semiconductor production settings. Boasting a ...
Novel developments also focus on quick and high-speed AFM to improve temporal resolution. 2 The combination of AFM with optical microscopy has expanded the number of possible applications, ...
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