Researchers from the labs of Professors Vinayak Dravid and Omar Farha developed a high-resolution approach to map ...

Dr. Michael Rauscher, Senior Director of the ZEISS Microscopy Materials Science Division, speaks to AZoM about field emission scanning electron microscopy - what it is, how it has developed since its ...

CORPUS CHRISTI, TX - In a variety of 'hit' television shows, forensic investigations and crime scenes investigator are often glamorized. Appealing to an audience desire to find the truth and the lure ...

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...

The Carl Zeiss AURIGA CrossBeam Focused Ion Beam Electron Microscope is a state-of-the-art advanced scanning electron microscope integrated with high-resolution focused ion beam milling that enables ...

MXenes are an important recent discovery in two-dimensional (2D) materials research. Since the unique 2D material class was discovered, electron microscopy techniques have been the primary method used ...

Scanning electron microscopy (SEM) has been an important tool for forensic science since the 1970s, and it continues to find forensic applications today. The technique – capable of 100,000x ...

A number of articles have been written to illustrate how automating scanning electron microscopy (SEM) imaging can save precious time for both researchers and operators. Scanning electron microscopes ...

The JEOL JSM-6500F is a Field Emission Scanning Electron Microscope (FESEM) w/Electron Beam Lithography attachment, and Nanometer Pattern Generation Systems (NPGS). It offers high resolution images of ...

Electron microscopes were once the turf of research laboratories that could foot the hefty bill of procuring and maintaining such equipment. But old models have been finding their way into the hands ...