Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...