Scanning electron microscopy (SEM), along with key analytical techniques, such as energy dispersive spectroscopy (EDS) and electron backscatter diffraction (EBSD), are essential for advanced materials ...
A focused ion beam scanning electron microscope (FIB-SEM) featuring a compact Time-of-Flight Secondary Ion Mass Spectrometer (ToF-SIMS) and a traditional microanalytical method of Energy Dispersive ...
Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
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