With Design-For-Test (DFT), test coverage is the typical yardstick used to gauge the quality of the manufacturing tests being performed. But as next-generation designs become more complex, traditional ...

Over the last decade, there has been a move away from powered-up digital in-circuit vector testing to unpowered analog-based (vectorless) device-pin opens testing for large and sometimes small digital ...

To ensure customers receive high-quality products, engineers must consider testing strategies before they even think about a schematic diagram. These days, most engineers realize boundary scan ...

The size of designs continues to grow and IC manufacturers are pushing for higher test quality, especially in mission-critical applications such as transportation and medicine. More advanced nodes ...

Techniques that reduce the difficulty and cost associated with testing an integrated circuit. This can result in a decrease in the time spent on a tester, a decrease in cost associated with generating ...

Fission neutrons for materials testing have been available for decades in hundreds of experimental reactors worldwide; an extensive database for irradiated materials is available. Unfortunately, ...